Diffraction: Difference between revisions
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===Optics=== | ===Optics=== | ||
*[[Focusing zone plates]] | *[[Focusing zone plates]] | ||
[[Category:XMG]][[Category:Diffraction]][[Category:Controls]] | [[Category:XMG]][[Category:Diffraction]][[Category:Controls]] | ||
Revision as of 16:47, April 14, 2009
Back to X-Ray Microscopy
Nanoprobe Instrument
- Focusing optics module (FOM)
- Condenser module (CM)
- Imaging optics module (IOM)
- Sample module (SM)
- Manual for Nanoprobe Instrument