Nanoprobe Scanning Quick Reference: Difference between revisions
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===Chamber overview === | ===Chamber overview === | ||
[[File:Chamber layout.png|thumb|left]] | [[File:Chamber layout.png|thumb|left]] | ||
[[File:Chamber interior.png|thumb| | [[File:Chamber interior.png|thumb|center]] | ||
The Nanoprobe Instrument (NPI) consists of a Focusing Optics Module which holds a Fresnel zone plate that is integrated with a central beam stop. This optic focuses through a differentially adjustable Order Sorting Aperture (OSA) so that the primary unfocused beam is blocked either by the central sotp or the OSA - this stage is also mounted on the FOM allowing the combination to be moved simultaneously. The combination of these two elements focuses the beam onto the Sample Module that provides translational and rotational control of the sample position. Laser interferometry is used to track the X/Y position of both the optic and sample stages relative to a common reference frame, allowing the user to scan the fine position of the optic differentially locked in to the sample position continuously correcting for most sources of uncontrolled positional drift over the scan. | The Nanoprobe Instrument (NPI) consists of a Focusing Optics Module which holds a Fresnel zone plate that is integrated with a central beam stop. This optic focuses through a differentially adjustable Order Sorting Aperture (OSA) so that the primary unfocused beam is blocked either by the central sotp or the OSA - this stage is also mounted on the FOM allowing the combination to be moved simultaneously. The combination of these two elements focuses the beam onto the Sample Module that provides translational and rotational control of the sample position. Laser interferometry is used to track the X/Y position of both the optic and sample stages relative to a common reference frame, allowing the user to scan the fine position of the optic differentially locked in to the sample position continuously correcting for most sources of uncontrolled positional drift over the scan. | ||
Revision as of 20:57, January 20, 2021
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Chamber overview
The Nanoprobe Instrument (NPI) consists of a Focusing Optics Module which holds a Fresnel zone plate that is integrated with a central beam stop. This optic focuses through a differentially adjustable Order Sorting Aperture (OSA) so that the primary unfocused beam is blocked either by the central sotp or the OSA - this stage is also mounted on the FOM allowing the combination to be moved simultaneously. The combination of these two elements focuses the beam onto the Sample Module that provides translational and rotational control of the sample position. Laser interferometry is used to track the X/Y position of both the optic and sample stages relative to a common reference frame, allowing the user to scan the fine position of the optic differentially locked in to the sample position continuously correcting for most sources of uncontrolled positional drift over the scan.
Coarse scanning
Image for coarse scanning here
Fine scanning
Image for fine scanning here
Focusing
Image for focusing here
