Diffraction: Difference between revisions
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[[Category:XMG]][[Category:Diffraction]][[Category:Controls]] | [[Category:XMG]][[Category:Diffraction]][[Category:Controls]] | ||
===Links=== | ===Links=== | ||
[http://xdb.lbl.gov/| X-ray Data Booklet] | [http://xdb.lbl.gov/ | X-ray Data Booklet] | ||
Revision as of 17:52, April 14, 2009
Back to X-Ray Microscopy
Nanoprobe Instrument
- Focusing optics module (FOM)
- Condenser module (CM)
- Imaging optics module (IOM)
- Sample module (SM)
- Manual for Nanoprobe Instrument