Diffraction: Difference between revisions
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*[[Coolsnap]] | *[[Coolsnap]] | ||
*[[PIXIS 1024XF]] | *[[PIXIS 1024XF]] | ||
===Optics=== | |||
*[[Focusing zone plates]] | |||
*[[Imaging zone plates]] | |||
[[Category:XMG]][[Category:Diffraction]][[Category:Controls]] | [[Category:XMG]][[Category:Diffraction]][[Category:Controls]] | ||
Revision as of 16:34, April 14, 2009
Back to X-Ray Microscopy
Nanoprobe Instrument
- Focusing optics module (FOM)
- Condenser module (CM)
- Imaging optics module (IOM)
- Sample module (SM)
- Manual for Nanoprobe Instrument