Diffraction: Difference between revisions
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| Line 3: | Line 3: | ||
===For Users === | ===For Users === | ||
*[[Sample Alignment Quick Reference]] | *[[Sample Alignment Quick Reference]] | ||
*[[Scanning Quick Reference]] | *[[Scanning Probe Diffraction Quick Reference]] | ||
*[[Data Analysis Quick Reference]] | *[[Data Analysis Quick Reference]] | ||
Latest revision as of 14:19, September 8, 2010
Back to X-Ray Microscopy
For Users
- Sample Alignment Quick Reference
- Scanning Probe Diffraction Quick Reference
- Data Analysis Quick Reference
Nanoprobe Instrument
- Focusing optics module (FOM)
- Condenser module (CM)
- Imaging optics module (IOM)
- Sample module (SM)
- NPI Manuals
- Manual for Nanoprobe Instrument
Detectors
Optics
Links
X-ray Data Booklet
Bragg law calculator
X-ray interactions with matter