Sample module (SM): Difference between revisions
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The sample module holds the specimen and can be translated in X, Y and Z. The sample holder | The sample module holds the specimen and can be translated in X, Y and Z. The sample holder | ||
can be exchanged for different experiments (rotation stage for tomography, cryo holder, etc.). The nanoprobe instrument consists furthermore of the [[Focusing optics module (FOM)|focusing optics module]], the [[Condenser module (CM)|condenser module]], and the [[Imaging optics module (IOM)|imaging optics module]]. | can be exchanged for different experiments (rotation stage for tomography, cryo holder, etc.). The nanoprobe instrument consists furthermore of the [[Focusing optics module (FOM)|focusing optics module]], the [[Condenser module (CM)|condenser module]], and the [[Imaging optics module (IOM)|imaging optics module]]. | ||
[[Category:XMG]][[Category:Fluorescence]][[Category:Diffraction]][[Category:Tomography]][[Category:Controls]] | |||
Latest revision as of 15:20, April 14, 2009
Back to X-Ray Microscopy
The sample module holds the specimen and can be translated in X, Y and Z. The sample holder can be exchanged for different experiments (rotation stage for tomography, cryo holder, etc.). The nanoprobe instrument consists furthermore of the focusing optics module, the condenser module, and the imaging optics module.