Diffraction: Difference between revisions
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Back to [[X-Ray Microscopy]] | |||
===For Users === | |||
*[[Sample Alignment Quick Reference]] | |||
*[[Scanning Probe Diffraction Quick Reference]] | |||
*[[Data Analysis Quick Reference]] | |||
===Nanoprobe Instrument=== | ===Nanoprobe Instrument=== | ||
*[[Focusing optics module (FOM)]] | *[[Focusing optics module (FOM)]] | ||
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*[[Imaging optics module (IOM)]] | *[[Imaging optics module (IOM)]] | ||
*[[Sample module (SM)]] | *[[Sample module (SM)]] | ||
*[[NPI Manuals]] | |||
*[[media:nanoPi_usersmanual_2007_07_20.pdf|Manual for Nanoprobe Instrument]] | *[[media:nanoPi_usersmanual_2007_07_20.pdf|Manual for Nanoprobe Instrument]] | ||
===Detectors=== | |||
*[[Coolsnap]] | |||
*[[PIXIS 1024XF]] | |||
*[[PI-LCX]] | |||
*[[MAR185]] | |||
===Optics=== | |||
*[[Focusing zone plates]] | |||
*[[Imaging zone plates]] | |||
===Links=== | |||
[http://xdb.lbl.gov X-ray Data Booklet] | |||
[[image:DataBook_Image_Small.jpg]]<br/> | |||
[http://www.desy.de/~luebbert/CrystalCalc_Cubic.html Bragg law calculator]<br/> | |||
[http://henke.lbl.gov/optical_constants/ X-ray interactions with matter] | |||
[[Category:XMG]][[Category:Diffraction]][[Category:Controls]] | [[Category:XMG]][[Category:Diffraction]][[Category:Controls]] | ||
Latest revision as of 14:19, September 8, 2010
Back to X-Ray Microscopy
For Users
- Sample Alignment Quick Reference
- Scanning Probe Diffraction Quick Reference
- Data Analysis Quick Reference
Nanoprobe Instrument
- Focusing optics module (FOM)
- Condenser module (CM)
- Imaging optics module (IOM)
- Sample module (SM)
- NPI Manuals
- Manual for Nanoprobe Instrument
Detectors
Optics
Links
X-ray Data Booklet
Bragg law calculator
X-ray interactions with matter