Diffraction: Difference between revisions
Jump to navigation
Jump to search
No edit summary |
No edit summary |
||
| Line 13: | Line 13: | ||
[[Category:XMG]][[Category:Diffraction]][[Category:Controls]] | [[Category:XMG]][[Category:Diffraction]][[Category:Controls]] | ||
===Links=== | ===Links=== | ||
[ | [http://xdb.lbl.gov/|X-ray Data Booklet] | ||
Revision as of 17:52, April 14, 2009
Back to X-Ray Microscopy
Nanoprobe Instrument
- Focusing optics module (FOM)
- Condenser module (CM)
- Imaging optics module (IOM)
- Sample module (SM)
- Manual for Nanoprobe Instrument